Calculate cost
Field emission scanning electron microscope CIQTEK SEM5000Pro (FE-SEM)
Name
E-mail
Phone number
Calculate cost
Manager will contact you and answer all your questions
By clicking the button, you agree to the terms of the privacy policy
Contact me
Name
E-mail
Phone number
Contact me
Manager will contact you and answer all your questions
By clicking the button, you agree to the terms of the privacy policy
Field emission scanning electron microscope CIQTEK SEM5000Pro (FE-SEM)
Calculate cost
Contact me
CIQTEK SEM5000Pro is a field emission Schottky scanning electron microscope (FE-SEM) that provides high resolution even at low excitation voltage. The use of advanced electron optics technology "Super Tunnel" ensures an uninterrupted beam path together with the design of the lens made of electrostatic and electromagnetic composition.
These achievements reduce the space charge effect, minimize lens aberrations, enhance the imaging resolution at low voltage, and achieve a resolution of 1.2 nm at 1 kV, which enables direct observation of non-conductive or semiconductor samples, effectively reducing the amount of radiation damage.
Features:
- Low voltage, high resolution
- High stability
- Built-in electron detector
- Sample replacement clamp (8-inch compatible)
- Multi-point aperture electromagnetic beam deflection
- Excellent expandability
Technical specifications:
Resolution: 0.8nm @ 15kV, SE, 1.2nm @ 1.0kV, SE
Acceleration voltage: 0.02kV ~ 30kV
Magnification (Polaroid): 1 ~ 2,500,000 x
Electron gun type: Schottky field emission electron gun
Camera: Dual cameras (optical navigation + camera monitor)
Stage range: X: 110mm, Y: 110mm, Z: 50mm, T: -10°ï½ +70°, R: 360°
Standard: Internal detector electrons, Everhart-Thornley Detector (ETD)
Operating system: Windows
Navigation: Optical navigation, fast gesture navigation, trackball (optional)
Automatic functions: Automatic brightness and contrast, autofocus, automatic stigmator