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Analytical field emission scanning electron microscope CIQTEK SEM4000Pro (FE-SEM)
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Analytical field emission scanning electron microscope CIQTEK SEM4000Pro (FE-SEM)
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CIQTEK SEM4000Pro is an analytical FE-SEM model equipped with a high-brightness and long-life field emission Schottky electron gun. The three-stage electromagnetic lens design provides significant advantages in analytical applications such as EDS/EDX, EBSD, WDS and more. It comes standard with a low vacuum mode and a high-performance low vacuum secondary electron detector, as well as a retractable backscattered electron detector that facilitates the observation of poorly conducting or non-conducting samples. Features:
Low vacuum mode
- High resolution (0.9 nm @ 30 kV)
- Excellent expandability
- Sample replacement clamp (compatible with 8-inch screens)
- Three-stage electromagnetic lens
- Mechanical eucentric stage
Technical specifications:
Resolution: High vacuum - 0.9 nm @ 30 kV, SE, Low vacuum - 2.5 nm @ 30 kV, BSE, 30 Pa, 1.5 nm @ 30 kV, SE, 30 Pa
Acceleration voltage: 0.2 kV ~ 30 kV
Magnification (Polaroid): 1 ~ 1,000,000 x
Electron gun type: Schottky field emission electron gun
Low vacuum: Max. 180 Pa
Camera: Dual cameras (optical navigation + camera monitoring)
XY range: 110 mm
Z range: 65 mm
T range: -10° ~ +70°
R range: 360°
Standard: Everhart-Thornley Detector (ETD), Low Vacuum Detector (LVD), Backward Electron Detector (BSED)
Operating system: Windows
Navigation: Optical navigation, quick gesture navigation, trackball (optional)
Automatic functions: Automatic brightness and contrast, autofocus, automatic stigmator