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Scanning electron microscope CIQTEK SEM3300 (SEM)
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Scanning electron microscope CIQTEK SEM3300 (SEM)
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Next-Generation Tungsten Filament Scanning Electron Microscope
The CIQTEK SEM3300 scanning electron microscope (SEM) incorporates technologies such as “super tunnel” electron optics, in-lens electron detectors, and electrostatic and electromagnetic compound objectives. By applying these technologies to a tungsten filament microscope, the long-standing resolution limit of tungsten filament SEMs is exceeded, allowing tungsten filament SEMs to perform low-voltage analysis tasks previously achievable only with field emission SEMs.
Functions:
- High resolution tungsten filament SEM
- Built-in electron detector
- Electromagnetic and electrostatic combined lens
- Safer to use
- Excellent expandability
Technical Specifications:
Resolution: 2.5nm @ 15kV, SE, 4nm @ 3kV, SE, 5nm @ 1kV, SE
Acceleration Voltage: 0.1kV ~ 30kV
Magnification (Polaroid): 1x ~ 300,000x
Camera: Optical navigation, Camera monitoring
Scene type: 5-axis vacuum motor compatible with motor
XY range: 125mm
Z range: 50mm
T range: - 10° ~ 90°
R range: 360°
Standard: In-lens detector electrons (internal lens), Everhart-Thornley Detector (ETD)Operating system: Windows
Navigation: Optical navigation, fast gesture navigation, trackball (optional)
Automatic functions: Automatic brightness and contrast, autofocus, automatic stigmator