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Scanning electron microscope CIQTEK SEM3200 (SEM)
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Scanning electron microscope CIQTEK SEM3200 (SEM)
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High-Performance and Versatile Tungsten Filament SEM Microscope
The CIQTEK SEM3200 is an excellent general-purpose tungsten filament scanning electron microscope (SEM) with outstanding overall capabilities. Its unique dual-anode electron gun structure provides high resolution and improves image signal-to-noise ratio at low excitation voltages. In addition, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical tool with excellent cost-effectiveness.
Features:
- Outstanding low voltage performance
- Dual anode electron gun
- Low vacuum mode
- Intelligent image astigmatism correction
- Pre-aligned tungsten filament
- Excellent expandability
Technical specifications:
Resolution: 3nm@30kV, SE, 7nm@3kV, SE, 4nm@30kV, BSE, 3nm@30kV, SE, 30Pa
Acceleration voltage: 0.2kV~30kV
Magnification (Polaroid): 1x~300,000x
Low vacuum: 5~1000Pa (optional)
Camera: Optical navigation, Camera monitoring
Stage type: 5-axis vacuum motor compatible with motor
XY range: 125mm
Range Z: 50 mm
T-range: - 10° ~ 90°
R-range: 360°
Standard: Everhart-Thornley Detector (ETD)
Operating System: Windows
Navigation: Optical navigation, Quick gesture navigation, Trackball (optional)
Automatic functions: Automatic brightness and contrast, autofocus, automatic stigmator