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Analytical scanning electron microscope with thermal field emission CIQTEK SEM4000X (FE-SEM)
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Analytical scanning electron microscope with thermal field emission CIQTEK SEM4000X (FE-SEM)
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CIQTEK SEM4000X is a stable, versatile, flexible and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of 1.9 nm at 1.0 kV and easily meets the challenges of obtaining high-resolution images of various types of samples. It can be upgraded to add a super beam retardation mode to further enhance the resolution at low voltage.
The microscope uses multi-detector technology with an in-column electron detector (UD) capable of detecting SE and BSE signals while achieving high-resolution operation. The chamber-mounted electron detector (LD) includes a crystal scintillator and photomultipliers, providing higher sensitivity and efficiency, enabling excellent quality stereoscopic imaging. The graphical user interface is user-friendly and equipped with automation functions such as auto brightness and contrast, auto focus, auto stigator and auto alignment, enabling rapid acquisition of super-resolution images.
Features:
- High resolution
- Multi-detector technology
- Simplified alignment
- Built on a higher-end platform
- Ultra-beam deceleration mode technology
- Excellent expandability
Technical specifications:
Resolution: 0.9nm@30kV, SE, 1.2nm@15kV, SE, 1.9nm@1kV, SE, 1.5nm@1kV (Ultra-beam deceleration), 1nm@15kV (Super-beam deceleration)
Acceleration voltage: 0.2kV~30kV
Magnification (Polaroid): 1~1,000,000x
Electron gun type: Schottky field emission gun
Camera: Dual cameras (optical navigation + camera monitoring)
Stage range: X: 110mm, Y: 110mm, Z: 50 mm, T: -10°~ +70°, R: 360°
Standard: Internal Electron Detector: UD-BSE/UD-SE, Everhart-Thornley Detector: LD
Operating System: Windows
Navigation: Optical navigation, Quick Gesture Navigation, Trackball (optional)
Automatic Functions: Automatic Brightness and Contrast, Auto Focus, Automatic Stigmator