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Scanning electron microscope CIQTEK SEM2100 (SEM)
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By clicking the button, you agree to the terms of the privacy policy
Scanning electron microscope CIQTEK SEM2100 (SEM)
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CIQTEK SEM2100 scanning electron microscope has a simplified workflow, meets industry standards and user habits in the design of "User Interface". Despite the minimalistic interface of the software, it provides comprehensive automated functions, measurement and annotation tools, image post-processing control capabilities, optical image navigation and more. The design of SEM2100 perfectly implements the idea of "Simplicity without sacrificing functionality".
Features:
- Intuitive, clear and easy-to-use user interface design
- Comprehensive automation functions
- Built-in image post-processing functions
- Built-in image post-processing functions
- Standard optical image navigation
- Safer to use
Technical specifications:
Resolution: 3.9 nm @ 20 kV, SE, 4.5 nm @ 20 kV, BSE
Acceleration voltage: 0.5 kV ~ 30 kV
Magnification (Polaroid): 1 x ~ 300,000 x
Camera: Optical navigation, Camera monitoring
Scene type: 3-axis, XYZ, compatible with vacuum motor drive
XY range: 125 mm
Z range: 50 mm
Standard: Everhart-Thornley detector (ETD)
Operating system: Windows
Navigation: Optical navigation, quick gesture navigation, trackball (optional)
Automatic functions: Automatic brightness and contrast, autofocus, automatic stigmator